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semiconductors

Failure Analysis

  • I/C Electrical
  • Characterization
  • Decapsulation
  • Dye Penetrant
  • X-Ray
  • Energy Dispersive X-Ray
  • Scanning Electron Microscope
  • Optical Microscope
  • Curve Tracer
  • O ⁄ S Test
  • Scanning Acoustic Microscope

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